Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...

BALTIMORE — The marriage of design-for-test (DFT) software with test hardware may drastically lower the cost of test, according to several companies that will present their plans at this week's ...

As the demand for processing power for artificial intelligence (AI) applications grows, semiconductor companies are racing to develop AI-specific silicon. The AI market is incredibly dynamic, with ...

Huge transistor counts, rising on-chip clock rates, the relentlessly escalating levels of integration in systems-on-chip, and the new types of defects seen in deep-submicron and nanometer processes ...