The field of nanoparticle imaging and characterisation has witnessed remarkable advances through the development of techniques that offer unprecedented spatial and temporal resolution while ...

Researchers from the University of Science and Technology of China (USTC) led by Prof. ZHANG Douguo have unveiled a planar optical device that significantly enhances the capabilities of dark-field ...

(Nanowerk News) X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult ...

Integrating deep learning in optical microscopy enhances image analysis, overcoming traditional limitations and improving ...