Allied Vision has announced the allPIXA pro 6000px, a Camera Link color linescan camera purpose-built for the relentless ...

The GI-307 High-Speed Inspection System from General Inspection, LLC (Gi) combines 360 degree dimensional metrology with 360 ...

Teledyne DALSA introduces its Linea ML 8k multispectral CLHS line scan camera for improved defect detectability with a single scan. Teledyne DALSA, a Teledyne Technologies [NYSE:TDY] company, is ...

The first SWIR line scan camera from Teledyne DALSA offers up to 74 dB dynamic range and spectral response from 950 to 1700 nm With exceptional responsivity and low noise, this newest Linea SWIR line ...

The GI-100DT uses a series of front and backlit cameras to calculate a part’s height, profile, and inner and outer diameters. Fasteners are critical components in engineered systems and structures, ...

MILPITAS, Calif.--(BUSINESS WIRE)--Today KLA-Tencor Corporation (NASDAQ:KLAC), the world’s leading supplier of process control and yield management solutions for the semiconductor and related ...

Manufacturers of aviation engine components are being impacted by Industry 4.0's emphasis on quality control. Industry 4.0 is challenging these manufacturers to rethink outdated QC processes and ...

Hyundai Transys has applied the AI technology-based system 'TADA (Transys Advanced Data Analytics)' to its production sites, increasing defect inspection accuracy to 99.9%. The TADA system is a ...

Wafers can be inspected for large, obvious defects, or for small, subtle ones. The former is referred to as macro-inspection, while the latter is micro-inspection. These processes use different ...

Semiconductor process engineers have always understood the need to inspect silicon wafers to identify defects and eliminate them at their source. To simplify the process, semiconductor equipment ...