Scientists have developed a technique that allows them to visualize defects on the surface of graphene. The technique may ultimately help scientists develop a better understanding of graphene’s ...
Researchers used AI-guided electron microscopy to map atomic-level point defects in 3D within ultrathin MXene layers, ...
October 26, 2012. Aegis Software announced that Sechan Electronics Inc., a contract manufacturing services company, chose Aegis’ Quality System as a replacement for Sechan's paper-based defect mapping ...
Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.
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