Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Have you ever designed a product that you thought was ready to ship only to have it fail testing by not meeting safety requirements? Months can be lost and mistakes repeated if a company doesn’t have ...

Identify sources of unnecessary cognitive load and apply strategies to focus on meaningful analysis and exploration.

Testing microprocessors is becoming more difficult and more time consuming as these devices are designed to take on more complex tasks, such as accelerating artificial intelligence computing, enabling ...