Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...

With small-scale CMOS technology nodes, the probability of physical defects occurring in the device increases. Various defects occur which cannot be detected with the help of conventional Single Stuck ...

Once IC fabrication is complete, engineers use fault models to create test patterns that detect defects. These fault models are typically abstractions of defect behavior based on our experience and ...