A research team has developed an operando reflection interference microscope (RIM) that provides a better understanding of how batteries work, which has significant implications for the next ...
Optical measurement techniques collecting light intensity in the far-field such as conventional and confocal microscopy or coherence scanning interferometry (CSI) enable fast and contactless ...
Automated DIC imaging with the DM6 M microscope enhances six-inch wafer inspection, providing reproducible results and improved efficiency for defect analysis.
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