A standard single frequency AFM is comprised of a boron-doped silicon (Si) or silicon nitride (Si 3 N 4) cantilever with a length of a few micrometers and a single crystal diamond tip at the bottom of ...
One of the common modes of scanning probe microscopy (SPM) is Magnetic force microscopy (MFM). As indicated by the name, SPM is used to map magnetic properties. On the nanoscale, MFM probes local ...
Magnetic force microscopy (MFM) is one of the modes of scanning probe microscopy (SPM). As the name implies, it is used to map magnetic characteristics. MFM investigates the local magnetic fields at ...
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