Within a short time, embedded designers will face major challenges associated with embedded memory at or around the 45-nanometer technology node. Industry leaders have already declared that ...

Exponential increases in data and demand for improved performance to process that data has spawned a variety of new approaches to processor design and packaging, but it also is driving big changes on ...

Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...