Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...
Today, PCBs are becoming more and more complex, and that means adequate test coverage is becoming harder and harder to achieve. Moreover, every test methodology has its limitations. As a result, many ...
Description: Discusses different aspects of VLSI testing and formal verification of designs. Design and manufacturing defect models are introduced along with test generation and fault simulation ...
Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...
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