About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.
The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
High quality and versatile Compression Testing Machine with certification of a UKAS accredited calibration. The Compression Testing machine CRT-CTM250-II was developed to perform a variety of ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Fort Worth, TX. ITC is underway this week, with companies on hand to highlight their software, switching systems, mmWave test cells, test structures, sensors, and power supplies. For example, ...
Timely delivery of highly reliable semiconductor products to market is essential to success in today’s competitive business environment. As if following through on this objective were not already ...
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