Design-Reuse

Genesys Testware introduces hierarchical test solution for logic and wiring in system IC

Anaheim, California, June 2, 2003. Genesys Testware, Inc., a leading supplier of embedded test solutions, today announced the introduction of HiertestMakerTM - a hierarchical test solution for logic ...
Design-Reuse

Genesys Testware Adds Top-Down Insertion of Test and Repair Circuits for Embedded Memory

FREMONT, Calif.--July 12, 2006--Genesys Testware, Inc., a leading supplier of yield, quality and cost optimization tools for nanometer ICs, announced today the addition of top-down insertion of test ...
InfoQ

Open Source Testware for Systematic IoT Testing: Eclipse IoT-Testware

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Andres Almiray, a serial open-source ...
EDN

Genesys Testware adds capabilities to ArraytestMaker

SAN FRANCISCO — Genesys Testware Inc. has added efficient automated insertion of embedded test and repair circuits for memory into system IC designs to it's ArraytestMaker product, the company said ...