(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...
Provides a complete range of structural measurements including powder diffraction, thin film metrology including thin-film method, preferred orientation, crystal quality, reflectometry and grazing ...
Diagram of an X-ray Reflectometry (XRR) setup: This schematic shows the arrangement of the X-ray tube, GÓ§bel mirror, sample holder, and detector. The X-rays are emitted from the tube, shaped by slits ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results