New NASA-level software framework reproduces DUT vs ΛCDM results, resolving Hubble and growth tensions with Δχ² = ...
PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
Abstract: The quality of modern software relies heavily on the effective use of static code analysis tools. To improve their usefulness, these tools should be evaluated using a framework that ...
Abstract: In reliability analysis, mixed Weibull distributions have gained considerable attention due to its exceptional flexibility in modeling complex failure mechanisms. In the practical analysis ...